| 00:00:00 | XRF Masterclass 1Theory of X-ray fluorescence spectrometry (XRF) |
| 00:05:33 | Content |
| 00:06:28 | What is XRF? |
| 00:07:40 | The Periodic Table of the Elements |
| 00:10:04 | Why use XRF? |
| 00:13:43 | Where is XRF used? |
| 00:14:53 | Benefits of XRF over ICP and AAS |
| 00:18:01 | What are X-rays ? |
| 00:19:16 | Production of x-rays in a sample |
| 00:20:41 | Production of x-rays in a sample |
| 00:23:13 | Characteristic radiation: the process |
| 00:23:44 | Characteristic lines: electron shells |
| 00:25:31 | The X-ray fluorescence spectrometer |
| 00:26:32 | Different types of XRF spectrometers |
| 00:28:15 | ED-XRF vs WD-XRF |
| 00:30:05 | ED-XRF technology |
| 00:30:42 | ED-XRF optics: basic differences |
| 00:31:44 | Simple 2D ED-XRF Optics |
| 00:32:27 | Polarized ED-XRF |
| 00:33:28 | WD-XRF technology |
| 00:34:43 | WD-XRF technology |
| 00:35:38 | Overview XRF technologies |
| 00:37:56 | Instrument calibration |
| 00:38:06 | Principle of XRF |
| 00:39:15 | Overview |
| 00:41:14 | Conventional calibration |
| 00:41:47 | Conventional calibration |
| 00:42:35 | Conventional calibration: set-up |
| 00:43:53 | Conventional calibration: routine analysis |
| 00:44:45 | Standardless analysis |
| 00:45:00 | Elemental SCREENING |
| 00:46:43 | Conclusion |
| 00:47:17 | Conclusions |
| 00:49:19 | Master classes:1. Theory of XRF2. ED versus WD-XRF3. Sample preparation – fused bead versus pressed powder |
| 00:50:11 | Thank you for your interest |
| 00:50:33 | Q&A |
This is the first of three masterclass web seminars covering X-ray Fluorescence, the theory and basics of X-ray fluorescence spectroscopy was presented. Join us for one or all three.
X-ray fluorescence (XRF) is an analytical technique that can be used to determine the chemical composition of a wide variety of sample types including solids, liquids, slurries, and loose powders. It can quantify elements from beryllium (Be) up to americium (Am) in concentrations from 100% down to sub-ppm levels. This masterclass explained the theory of XRF, its principles, the different types of XRF analyzers: wavelength dispersive (WDXRF) and energy dispersive (EDXRF), and its benefits in comparison with other elemental techniques like ICP and AAS.
発表者
Dr. Lieven Kempenaers
Twenty years ago, in 1999 Lieven Kempenaers started his PhD in Chemistry at the University of Antwerp (Belgium) with dedicated focus on the use of X-rays in elemental analysis. In the course of his PhD, Lieven wrote many articles of which one was awarded as "best article of the year 2000".
In 2003 Lieven completed his PhD in Chemistry and used his XRF knowledge and experience as an XRF Application Specialist and later on as Product Manager for Malvern Panalytical, the Netherlands. After 5 years, he was re-located to the Asia Pacific regional head quarters in Singapore and took on the assignment as Asia Pacific Regional Product Manager XRF.
Once back in the Netherlands in 2012, he used his Asia Pacific experience as the global product manager for the benchtop XRF instruments.
詳細
Who should attend?
- Everybody working in a process control or QC environment, or research and development laboratory, in every industries segment
Why attend?
- To obtain a better understanding of the XRF technique, the different types and its advantages and disadvantages, in comparison with other elemental techniques like ICP and AAS