When faced with fully unknown samples, or in cases where calibration standards or reference materials are not easily accessible or available at all, standardless XRF analysis is a valuable solution. Omnian is a highly advanced yet easy to use standardless analysis module, covering all elements from F to U. Quantitative results can be obtained for a wide variety of sample types like pressed powders, fused beads, loose powders and liquids. Important applications include elemental analysis of “one-of” samples, screening and failure analysis.
The Omnian Expertise Program
This Expertise program delivers a complete and ready to use standardless analysis solution for Malvern Panalytical WD XRF and benchtop EDXRF range systems. Processing parameter setup for various material types are included as well as a full validation and drift monitoring workflow. For Zetium, Axios or MagiX spectrometers the Fast Scan setup is included, enabling quantification across the full elemental range in less than 2 minutes. The Omnian setup can be refined for specific material types by including TAG set-up samples. Peak based measurements for enhanced quantification of traces and minors can be included on request.
Included:
Optional
Prerequisites
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* SPC is already included with Zetium systems
