The 30th OMA is a great way to discover the latest advancements in mining and minerals. Catch up with day 2 to find out more about significant production returns with innovative technology and high equipment performance (efficiency).
You can watch day 1 here.
This event gathers industry experts as well as our own experts to discuss exploration, process optimization and tailings management. New advances in elemental analysis (X-ray and neutron analysis), mineralogical analysis (X-ray diffraction and near-infrared (NIR)), on-line analysis (elemental, mineralogical and particle size) and sample preparation will be covered.
Day 2: Get significant production returns with innovative technology and high equipment performance (efficiency)
Time (EDT) | Time (CET) | Subject | Presenter |
---|---|---|---|
11:00 am | 5:00 pm | High quality analysis: it starts with high quality standards | Chantal Audet, Product Manager, Malvern Panalytical (Canada) |
11:20 am | 5:20 pm | Benchtop XRD demo | Dr. Luciano Gobbo, XRD Applications - Building Materials and Minerals, Malvern Panalytical (USA) |
11:40 am | 5:40 pm | Determination of hardrock lithium concentrates using X-ray diffraction (CRD) in combination with statistical methods | Dr. Herbert Pollmann, Head of Department, Institute of Geosciences and Geology, Martin Luther University Halle-Wittenberg (Germany) |
12:00 pm | 6:00 pm | Application of powder X-ray diffraction for defining ore hardness | Dr. Craig McClung, Principal Advisor - OBK Productivity and Technology, Rio Tinto Copper Technical, Rio Tinto (USA) |
12:20 pm | 6:20 pm | Portable NIR demo | Dr. Luciano Gobbo, XRD Applications - Building Materials and Minerals, Malvern Panalytical (USA) |
12:40 pm | 6:40 pm | Potential of reflectance spectroscopy for vectoring towards and detecting mineralized areas, case study of the Canadian Malartic Au deposit | Dr. Philip Lypaczewski, Faculty Researcher, College of the North Atlantic (Canada) |
1:00 pm | 7:00 pm | General questions and answers session |