| 00:00:00 | XRD phase characterisation & challenges |
| 00:06:20 | Elemental analysis: how it complements XRD |
| 00:09:33 | Elemental analysis using X-ray fluorescence |
| 00:15:49 | XRF for small spot mapping, layer thickness |
| 00:27:00 | Phase mapping demo on HighScore Plus software |
| 00:52:38 | Q & A |
X-ray diffraction
is one of the most powerful tools for identifying unknown crystalline phases. And there are various databases that crystallographers can reference against, for instance ICDD. By comparing the positions and intensities of the diffraction peaks against a library of known crystalline materials, the target material can be identified. This action is known as phase search mapping. Because this method of phase search scanning involves the mathematical matching of such scans, it is possible that the phase mathematically matches to the XRD pattern, but not actually be in the sample.
During this webinar, we discuss about such confounding errors where incorrect phases were recognised. And importantly how such errors can be minimized or eliminated by way of narrowing the search mapping by way of understanding the chemistry or elemental composition of the material.
Interested to learn more?
Join our free series of webinars: "Better XRD data analysis and interpretation for materials characterization":
- Webinar 1: Introduction to powder X-ray diffraction.
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- Webinar 2: Studying battery cathode materials using X-ray diffraction
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- Webinar 3: Expand your powder XRD applications for materials characterization research
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- Webinar 4: Good vs bad XRD patterns: how to improve your phase analysis.
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- Webinar 5: Better XRD data quality: importance of good sample preparation.
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- Webinar 6: Improving your phase search mapping by defining your elemental range: introduction to elemental analysis using X-ray fluorescence.
- Webinar 7: Live demo at your desk - latest high performing XRD Benchtop.
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- Webinar 8: XRD phase quantification tutorial - improve your XRD data analysis.
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- Webinar 9: XRD data analysis on HighScore Plus version 4.9 - what's new?
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- Webinar 10: Range of XRD instruments to aid materials characterization research.
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発表者
Hari Bhaskar, Manager for Process and Automation Solutions for Malvern Panalytical
Hari holds a Bachelor's degree in Engineering and has been working with the company for the last 20 years in various capacities - Service, Sales, Application and Product Support.
Hari is currently based in Perth, Western Australia. He has worked with customers from various segments including cement, mining, metals, pharmaceuticals, academia, oil and petrol chemicals, service labs and more, providing advice on Malvern Panalytical’s fusion sample preparation,
XRF
, XRD, CNA solutions for their applications. Hari has sound product knowledge and extensive experience in method development for a wide range of application areas.
Hari is also the Course Director for various training and application courses such as “XRF at the workplace”, “SuperQ XRF software” and “HighScore XRD software”.
よくある質問
Who should attend?
• Researchers involved in materials characterization analysis who want to expand their knowledge in X-ray diffraction
• Relevant industries include (but are not limited to) those researching on battery, powder metallurgy, cement, mining and minerals, environmental monitoring, pharmaceuticals and more
• R and D and manufacturing leaders responsible for appropriate analytics selection
• Scientists engaged in method development for new materials or in supporting root cause analysis investigations in support of product manufacturing
How long is this webinar?
30 minutes is the intended speaker time with additional time for addressing queries.