See more with XRD2DScan - the advanced tool for 2D X-ray diffraction analysis

2D X-ray diffraction is one of the most appealing techniques for users who are interested in extracting every bit of information about their samples such as anisotropic features in polymers or crystallite size of polycrystalline samples, sample texture, and inhomogeneity.

Two-dimensional (2D) diffraction patterns collected using area detectors, available in modern X-ray diffractometers, contain detailed information about the material’s phase composition, crystallinity and structural organization from the macro- to the nano-scale. Furthermore, the high sensitivity and resolution of newer detectors make possible collection of material structural information (phase composition, orientation, texture, etc.) within seconds which allows following material transformation processes in real-time (crystallization, phase transformation, deformation).

Join us, as we present a new version (8.0) of the XRD2DScan - comprehensive Malvern Panalytical software for displaying, processing and analyzing 2D X-ray diffraction data. It enables you to extract information from 2D data in an easy and intuitive way. The latest version of the software (version 8.0) builds on the success of the previous releases. Now, in addition to orientation and crystallite size, you can calculate pole figures using 2D data set, create peak maps to visualize sample inhomogeneities. Extended scripting functionality further simplifies the analysis automation, aand dditional image treatments expand the easy-to-use toolset for 2D/1D data treatments and corrections.

In this webinar, our application specialist, Anil Kumar, will introduce these new options with a live demonstration. A few case study examples will be discussed.