One benefit of XRF technology is the simplicity for its users to run Standard Operating Procedures (SOP) routinely and to get high-quality data. Before implementing these SOPs, some will want to tweak and adjust specific parameters to get the best results from their samples and from the instrument.
Malvern Panalytical is pleased to present this complimentary virtual user meeting for our Energy Dispersive (ED) XRF range of systems, a great opportunity to expand your knowledge and to ask your questions to our specialists. This meeting will review the process of sample preparation, calibration and method validation; we will also advise on tips and strategies to understand the intricacies of the technique to develop game-changing solutions for your analyses.
Vortragende
- Stephen Williams - Senior Applications Specialist, Malvern Panalytical
- Debbie Siples - XRF Applications Scientist, Malvern Panalytical
- Dylan Lundgren - XRF application scientist, Malvern Panalytical
- Greg Wortman - Senior Scientist, Honeywell
Weitere Informationen
Who should attend?
- Laboratory professionals with EDXRF experience in environmental, manufacturing, mining and materials industries;
- Experts from research laboratories who want to learn more about XRF technologies.
What will you learn?
- Overview of our Energy Dispersive systems: Epsilon 1, Epsilon 4, Revontium and their respective softwares (including Omnian methods);
- Preparation and validation of a good XRF method on ED systems;
- Practical advices on the choice of calibration standards and of a sample preparation method;
- Best practices to harmonize XRF applications on multiple instruments and across different sites.