Ask an Expert: Advances in Material Science: Exploring Novel Perovskite and Thin Film Technologies
- 產品:
- X'Pert3 系列, XRD 軟體
- 技術類型:
- X光繞射(XRD)
- 產業應用:
- 學術界, 學院, 半導體/電子
XRD software
Our XRD software packages are designed to extract every bit of information from your material. We offer intuitive data collection software tailored to research or process control use, and state-of-the-art analysis modules for the many XRD applications possible on our instruments.
From Highscore to AMASS, you can find our current XRD software downloads here.
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活動和培訓
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Hybrid X-ray metrology with the Freeform method
- 產品:
- XRD 軟體, X'Pert3 系列, Empyrean
- 技術類型:
- X光繞射(XRD)
- 產業應用:
- 半導體/電子, 學術界
Unveiling AMASS 2.0 - X-Ray Diffraction Software
- 產品:
- X'Pert3 MRD (XL), X'Pert3 MRD, XRD 軟體
- 技術類型:
- X光繞射(XRD), X光散射
How an x-ray diffractometer can automate thin film metrology
- 產品:
- X'Pert3 系列, X'Pert3 MRD (XL), XRD 軟體
- 技術類型:
- X光繞射(XRD)
- 產業應用:
- 能源/電池, 先進製造
Free online workshop: Advance your thin films research for battery, semiconductor, electronics and more (Mandarin language)
- 產品:
- Empyrean 系列, 偵測器, X'Pert3 系列, XRD 軟體
- 技術類型:
- X光繞射(XRD)
- 產業應用:
- 航太, 學院, 能源/電池, 半導體/電子, 金屬, 汽車
XRD phase quantification tutorial: Rietveld refinement
- 產品:
- Aeris 系列, Empyrean 系列, XRD 軟體
- 技術類型:
- X光繞射(XRD)
- 量測類型:
- 相鑑定, 相定量, 晶體結構測定
XRD phase quantification tutorial: crystallinity calculation
- 產品:
- Aeris 系列, Empyrean 系列, XRD 軟體
- 技術類型:
- X光繞射(XRD)
- 量測類型:
- 相鑑定, 相定量, 晶體結構測定