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Empyrean
智慧型 X 光繞射儀
- 测量
-
Crystal structure determination
3D structure / imaging
Contaminant detection and analysis
Epitaxy analysis
Interface roughness
Texture analysis
Phase identification
Reciprocal space analysis
Phase quantification
Residual stress
- Goniometer configuration
- Vertical goniometer, Θ-Θ
- Particle size range
- 1 - 100 nm
- 技術類型
-
X-ray Diffraction (XRD)