Measuring sub nanometre sizes using dynamic light scattering

This paper discusses the factors which determine the lower size limit of DLS and reports the use of sucrose as a test sample to probe the lower limits. Measurement of sizes of less than 1 nm are possible due to the use of NIBS detection technology
This paper discusses the factors which determine the lower size limit of DLS and reports the use of sucrose as a test sample to probe the lower limits. Measurement of sizes of less than 1 nm are possible due to the use of NIBS detection technology

登入

還沒註冊? 创建账户