This is the 3rd masterclass of a four-part Masterclass series where we will delve into the result and data interpretation of size measurements taken using the Zetasizer Advance series. We will highlight the key parameters and charts available in ZS Xplorer software to help with data interpretation, and how to configure the software to display them. Furthermore, we will discuss how we can recognise good and poor data, understand the reasons why the data could be poor and what steps can we can take to improve it.
This session would be beneficial for anyone who is interested in learning about method development for dynamic light scattering sizing measurements or wants to have a better understanding of critical to quality parameters.
演講者
- Nellie Laleni - Application Specialist, Malvern Panalytical
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Who should attend?
- Scientists and researchers interested in method development for dynamic light scattering sizing measurements
- Compliance officers who are looking for an understanding of critical to quality parameters
What will you learn?
- Become confident in interpreting the data and results you have obtained from size measurements taken with a Zetasizer Advance instrument.
- Learn how to configure ZS Xplorer software to display key parameters and charts to aid interpretation.
- Recognise good and poor data, understand the reasons for poor data and what can be done to improve it.
Want to learn more?
- Take a look at the full series and useful related content: Discover the smartest way to measure particle size
- Watch the second part of the Zetasizer Masterclass series: Zetasizer Masterclass Edition 2 webinar series