| 00:00:00 | Welcome |
| 00:00:09 | Agenda |
| 00:04:43 | Laser diffraction particle size analysis for additive manufacturing |
| 00:05:58 | Overview |
| 00:06:27 | Additive Manufacturing: advantages |
| 00:07:14 | Additive Manufacturing: Challenges |
| 00:08:18 | Additive Manufacturing: Powder bed processing |
| 00:09:20 | Additive Manufacturing: Powder bed processing |
| 00:11:26 | Measuring particle size using laser diffraction |
| 00:11:40 | How does laser diffraction work? |
| 00:12:25 | Particle size analysis using laser diffraction |
| 00:13:39 | How does the instrument work? |
| 00:14:35 | How does the instrument work? |
| 00:15:31 | The Mastersizer 3000 |
| 00:16:16 | Laser diffraction results |
| 00:17:16 | Laser diffraction examples |
| 00:17:27 | Particle size analysis |
| 00:19:29 | Additive Manufacturing: recycling powder |
| 00:20:59 | Particle size analysis |
| 00:22:03 | In-process laser diffraction |
| 00:23:08 | In-process laser diffraction |
| 00:23:47 | Comparison of Mastersizer and Insitec |
| 00:24:07 | InnovateUK: Powdercleanse |
| 00:24:38 | InnovateUk: Powdercleanse |
| 00:25:08 | Any questions? |
| 00:25:30 | Analytical Imaging for Additive Layer ManufactureDr Robert TaylorTechnical Specialist – Analytical Imaging and Laser Diffraction |
| 00:27:10 | Morphologi 4 & 4ID Hardware |
| 00:28:24 | Morphological imaging workflow |
| 00:29:45 | Morphological results |
| 00:30:25 | Morphological shape descriptors |
| 00:31:27 | Result interpretation |
| 00:31:46 | How can particle shape be measured? |
| 00:32:56 | Sample Presentation |
| 00:33:58 | Result interpretation |
| 00:34:57 | Result interpretation |
| 00:37:23 | Additive Layer Manufacture |
| 00:37:28 | Additive Manufacturing: Powder Bed Formation |
| 00:38:46 | Additive Manufacturing: Powder Bed Formation |
| 00:40:04 | Additive Manufacturing: Powder Bed Formation |
| 00:41:12 | Additive Manufacturing: Powder Bed Formation |
| 00:42:00 | Particle Size and Shape Analysis |
| 00:42:13 | Sample Preparation |
| 00:42:57 | Particle Classification |
| 00:44:30 | Particle Classification Continued |
| 00:45:03 | Classification Charts |
| 00:46:00 | Comparison of Fines |
| 00:47:10 | The analysis of metal powder, using XRF. |
| 00:49:24 | The analysis of metal powder, using XRF |
| 00:50:09 | What is X-Ray Fluorescence (XRF) |
| 00:51:02 | The tube spectrum |
| 00:52:07 | Sample spectrum |
| 00:52:44 | Typical XRF Spectrometer types |
| 00:54:39 | Why use XRF? |
| 00:55:35 | Powder samples: how to analyse? |
| 00:57:34 | Powder samples: how to analyse? |
| 00:58:30 | Analysis according ASTM norms |
| 00:58:45 | Powder analysis of a metal powder: FeSi |
| 00:59:50 | Why this spread? |
| 01:00:30 | Particle size and metallurgical effects |
| 01:01:18 | Fused bead analysis of FeSi |
| 01:02:01 | Calibration: Fused beads vs pressed powder |
| 01:02:48 | Fused beads vs. pressed powder |
| 01:04:02 | Sample preparation summary |
| 01:04:56 | Fused bead reproducibility (Zetium 1kW) |
| 01:06:45 | Comparison of LLD’s in WD-XRF |
| 01:07:24 | But what about ED-XRF? |
| 01:07:44 | Calibrations on Epsilon 3 ED-XRF |
| 01:08:18 | Repeatability on pressed powder |
| 01:08:51 | ED-XRF, now fully capable of routine analysis |
| 01:09:19 | Recent developments |
| 01:10:07 | Conclusion |
| 01:11:15 | Using X-rays to see inside your powdered metal materials and processes |
| 01:13:07 | Overview |
| 01:13:29 | Introduction |
| 01:15:00 | What information can be derived from XRF/XRD? |
| 01:16:35 | X-ray diffraction (XRD) |
| 01:17:29 | X-ray diffraction (XRD) |
| 01:20:12 | Equipment |
| 01:20:15 | XRD systems |
| 01:21:29 | Application Examples |
| 01:21:43 | Phase analysis |
| 01:23:44 | Phase analysis – Rietveld full pattern analysis |
| 01:25:28 | Phase analysis – Ferrite-Martensite-Austenite-Cementite |
| 01:26:13 | Phase analysis – Ferrite-Martensite-Austenite-Cementite |
| 01:27:13 | Application Examples |
| 01:27:23 | Line profile analysis |
| 01:28:42 | Crystallite size & microstrain analysis |
| 01:29:44 | Crystallite size & microstrain analysis |
| 01:30:30 | Application Examples |
| 01:30:38 | AM Case Study 1 |
| 01:31:57 | AM Case Study 1 |
| 01:33:16 | AM Case Study 2 |
| 01:34:11 | AM Case Study 2 |
| 01:35:43 | Thank you for your attentionSend your questions to:events@malvernpanalytical.com |
| 01:36:01 | Questions and Thank You! |
Up to one third of the production cost of an additive manufacturing component produced by powder bed processes (particularly metals) is the cost of the powder used, with commercial viability resting on establishing a robust supply chain and effective powder recycling strategies. More importantly, the chemical and physical properties of the powder directly impact the build process and final component quality and must be controlled and optimized to ensure process robustness and consistency. To achieve this, powder properties must be characterized at various stages in the supply chain, from new alloy development through to powder recycling.
This online seminar, with a duration of 1h 45min, will provide an overview of four key analytical techniques that are commonly used to characterise additive manufacturing powders, including laser diffraction, automated image analysis, X-ray fluorescence and X-ray diffraction, and the benefits they offer.
演講者
Anne Virden Ph.D.
Product Technical Specialist for Diffraction and Analytical Imaging. Anne joined Malvern in 2007 with a PhD in Physics from the University of York. She has since been supporting Malvern’s Mastersizer and Spraytec customers and has built up wide ranging experience of particle sizing in industries including paints and pigments, pharmaceuticals, mining and minerals, and is a particular expert in the measurement of spray systems. Anne has also recently taken on responsibility for Malvern’s Analytical Imaging systems.
Marco Sommariva
Marco Sommariva is currently Team Leader XRD in the Malvern Panalytical Application Competence Center, in Almelo, The Netherlands. He studied Material Science in Milan (Italy), with a thesis on synthesis and characterization of solid electrolytes for lithium batteries. Marco then moved on as a post-doc at the Rutherford Laboratory in the UK, working on a project about complex hydrides for hydrogen storage, before joining PANalytical in 2011 as application specialist XRD, in Almelo (the Netherlands).
Robert Taylor Ph.D.
Having spent nearly 4 postgraduate years firing lasers at precious metals, Rob moved into developing electrochemical and spectroscopic applications in pharmaceutical development. The following 8 years was a journey in understanding physicochemical properties of drugs. Since joining Malvern Panalytical as an imaging Technical Specialist, Rob is now discovering the applications of particle size and shape in, not only pharmaceutical products, but also food and advanced materials.
Armand Jonkers
Armand Jonkers is currently senior application specialist XRF in the Malvern Panalytical Application Competence Center, in Almelo (the Netherlands). He studied analytical chemistry in Eindhoven, the Netherlands, where his thesis handled about the analysis of metals in organic solutions using Inductively Coupled Plasma (ICP). After he started working at Philips IE (now Malvern Panalytical), where he was active in Optical Emission techniques (ICP, Spark-OES, Arc-OES, GDL-OES). In 1992 he moved to the XRF department, where he is still active and specialized in thin-film and metal analysis. Besides that, he is responsible for OQ procedures for XRF.