| 00:00:00 | Welcome |
| 00:00:13 | Introductions |
| 00:01:19 | Agenda |
| 00:02:43 | International Standards |
| 00:04:26 | Accuracy |
| 00:05:15 | A single result is always precise |
| 00:05:24 | Why verify? |
| 00:07:25 | Poll |
| 00:08:05 | Precision |
| 00:09:57 | Reproducibility |
| 00:10:02 | Accuracy |
| 00:10:31 | An ideal reference material |
| 00:12:15 | Poll |
| 00:13:36 | Qualification |
| 00:14:43 | Instrument preparation |
| 00:15:19 | Qualification test |
| 00:16:06 | Instrument to Instrument ComparisonMalvern Verification Approach – A dual approach |
| 00:17:47 | Instrument to Instrument ComparisonVerification Approach – A dual approach |
| 00:18:53 | What if it fails? |
| 00:19:25 | Background data and system cleanliness |
| 00:19:30 | Poor background - material stuck to the windows |
| 00:19:47 | Poor background – contaminated dispersant |
| 00:20:59 | Low obscuration limit: signal to noise ratio |
| 00:22:21 | What defines the upper obscuration limit? |
| 00:23:01 | What defines the upper obscuration limit? |
| 00:23:20 | Wet analysis - multiple scattering |
| 00:24:04 | High obscuration limit: multiple scattering |
| 00:24:18 | Target obscuration ranges: Wet measurements |
| 00:24:32 | Target obscuration ranges: Wet measurements |
| 00:24:39 | Reference materials in store |
| 00:24:44 | QAS |
| 00:25:21 | QAS: Batch 3 |
| 00:25:47 | QAS: Batch 3 |
| 00:26:12 | Pre-empting a question |
| 00:26:17 | Need to test all detectors |
| 00:27:47 | So… |
| 00:28:05 | Thank you for your Attention.Any Questions? |
| 00:36:15 | Contact Information |
International guidance documents relating to the use of laser diffraction, such as ISO133220:2009 and USP<429>, highlight the importance of using Certified Reference Materials to test the performance of laser diffraction systems during their lifetime. This is particularly important when laser diffraction is used as part of Quality Control operations or within audited laboratories, as testing using reference materials provides a baseline performance verification which provides assurance that any sample measurement variability relates to the product being tested rather than drift in the instrument performance.. The webinar will be presented by Dr Steve Ward-Smith, who is a member of the ISO TC24/SC4 Particle Characterization committee where he advises on future guidance relating to the use and verification of laser diffraction systems.