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NanoSight LM10

Malvern NanoSight LM10 장비는 나노 입자 특성 분석을 위해 사용하기 간편하고 재현 가능한 플랫폼을 제공합니다.

LM10은 장비 구성과 시료 유형에 따라 직경 20nm ~ 1000nm의 모든 종류의 나노 입자의 크기 분포와 농도를 빠르게 자동으로 분석합니다.

지원팀 연락처

사용자 매뉴얼

소프트웨어 다운로드

05 October 2020

3.44

Capture

    • USB camera support.

Other

    • Improved logging. Instrument log files will no longer be overwritten at the start of each day.

    • Improved handling of corrupt/unreadable video files.

    • New script command for automated/unattended data export.

    • Resolved HASP issues in Windows 10 (Version 2004)

3.44

08 January 2019

3.40

Improvements including:

  • USB camera support
  • Improved logging
  • Improved handling of video files
  • New script commands for data export
3.40

27 July 2018

3.30

Improvements including:

  • New SOP pages
  • CFR
3.30

27 November 2015

3.20

Improved Automation

  • Auto-setup, auto-level, focus-level, and auto-focus script commands available
  • Script command to change experiment filename
  • Make background script commands added
  • Changes to continuous flow SOP scripts to ensure smooth flow

Exports

  • Laser color added to nanolog.csv and other outputs

Interface changes

  • Run button on Recent Measurements page
  • User direction messages for capture and process settings improved
  • User Positions 1 and 2 removed

Additional features

  • Optional CFR feature available – audited operation, secure login, data integrity checking, user level program configuration
  • CFR feature can be enabled by adding feature code to CFR security dongle
  • The CFR feature is available as a chargeable upgrade – Part No. PSS0054 for new builds, Part No. NTA4165 as an upgrade for customers running NTA 3.2 software

Other

  • Extended camera log for diagnostic purposes, can revert to daily usage via nano.ini
3.20

15 June 2015

3.10-I2

Improvements and Features

  • Concentration measurement upgrade option for NS500 and single and multi-laser NS300

Improved Automation

  • Automatic focus available for NS300 and NS500
  • Automatic camera level for all instruments

Data Display and Manipulation

  • Flexible data overlays for line graphs and scatter plots
  • CSV and PDF export options for overlaid data
  • Ability to report concentrations between specific size limits
  • Option to ‘exclude’ regions of particles from the scatter plot
  • Updated display for zeta plots

Interface changes

  • Quick access to recent experiments through dedicated tabbed window
  • Experiments display overlaid graphs and scatterplots on load
  • Improved flexibility and usability for graph settings
  • Filter wheel has its own hardware tab, with customisable buttons
  • Procedure guide for electrode air removal
  • Warnings to remind user of essential hardware checks/maintenance

Additional improvements

  • Refined camera levels to give more suitable settings for brighter particles
  • Refined detection threshold range
  • Speed optimised size distribution algorithm runs up to 20 times faster
  • Refined focus and stage controls for ease-of-use
  • Option to correct viscosity and dilution after making a measurement
  • Improved hardware auto-detection and reconnection menus
3.10-I2

30 March 2015

3.10-I1

Improvements and Features

  • Concentration measurement upgrade option for NS500 and single and multi-laser NS300

Improved Automation

  • Automatic focus available for NS300 and NS500
  • Automatic camera level for all instruments

Data Display and Manipulation

  • Flexible data overlays for line graphs and scatter plots
  • CSV and PDF export options for overlaid data
  • Ability to report concentrations between specific size limits
  • Option to ‘exclude’ regions of particles from the scatter plot
  • Updated display for zeta plots

Interface changes

  • Quick access to recent experiments through dedicated tabbed window
  • Experiments display overlaid graphs and scatterplots on load
  • Improved flexibility and usability for graph settings
  • Filter wheel has its own hardware tab, with customisable buttons
  • Procedure guide for electrode air removal
  • Warnings to remind user of essential hardware checks/maintenance

Additional improvements

  • Refined camera levels to give more suitable settings for brighter particles
  • Refined detection threshold range
  • Speed optimised size distribution algorithm runs up to 20 times faster
  • Refined focus and stage controls for ease-of-use
  • Option to correct viscosity and dilution after making a measurement
  • Improved hardware auto-detection and reconnection menus
3.10-I1

15 July 2014

3.0

Improvements and Features
  • Redesigned interface, focusing around repeat measurements
  • Improved particle size distribution algorithm
  • Automatic, integrated hardware detection and communication
  • Increased compatibility with networked computers
  • Easy setup with new installer package
  • Additional features
  • New file system with less files per experiment
  • Improved particle detection and tracking
  • Improved vibration correction
  • Settings stored in the registry rather than .ini file
3.0

14 October 2024

1.2

  • Maintenance including improved tracking algorithms

See SUN for more details.

1.2

23 February 2024

1.1

  • Project export and import
  • General workflow and existing feature improvements
  • Improved robustness for fluorescence measurements
  • Minor bug fixes

See SUN for more details.

1.1

10 May 2023

1.0

NanoSight Software Activation Tool v1

1.0

14 September 2023

1.0

NS Xplorer is the software for the NS Pro instrument

  • 1st Release
1.0

악세서리

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Malvern NanoSight 시린지 펌프는 모든 Malvern NanoSight 시스템에 사용할 수 있으며, 이 시린지 펌프를 사용하여 일정한 흐름 속도로 시료 분석을 수행할 수 있습니다.

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