Aeris Guía de usuario
Version number: 7
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The combination of usability and performance takes your lab work to a new level.
Aeris Research Edition gives you better information and deeper insights, so you can get to the answers more effectively, refine your materials, advance your knowledge and push forward that scientific frontier.
Whatever project you are working on, the fast acquisition of phase information from your sample in question can be crucial for your research.
Just collect X-ray diffraction data with Aeris Research and subsequently employ the HighScore suite to obtain a wealth of crystallographic information.
With measurement configurations including reflection, transmission and grazing incidence X-ray diffraction (GIXRD), you have all you need to get the best data for any type of polycrystalline material.
The most intuitive X-ray diffractometer: Aeris is an easy-to-operate and user-friendly benchtop X-ray diffractometer. With its intuitive operation, Aeris makes X-ray diffraction so simple that it is accessible for everyone.
The unique touch screen user interface lets you proceed effortlessly through the measurement process of your samples. Your results are always just a few taps away:
Outperforming expectations
Aeris is your workhorse for rapid and reliable phase identification and Rietveld analysis of powder samples.
Thanks to the incorporation of technologies that have already proven their benefits on Malvern Panalytical's high-end systems, the Research edition of Aeris delivers data quality that was previously only possible with a full-size floor-standing system.
With the optional 2D detector you can teach the fundamentals of powder diffraction in a visual manner.
Aeris is very flexible and offers possibilities for all sorts of powder diffraction measurements.
The instrument can accommodate various types of sample holders in combination with a sample changer and it can be equipped with a BTS 500 Benchtop Heating Stage.
No cooling water, no chiller, no compressed air.
The only thing you need is a single-phase power socket.
The instrument is desktop, easy to use, analyzes the samples very quickly and is economic."
Sacari Sacari Elisban Juani — Universidad Nacional Jorge Basadre Grohmann
| Sample loading | External sample loading |
|---|---|
| Sample holders | Variety of full-sized sample holders capable meeting all requirements |
| Sample changing | Choose between a manual loading dock, 6-position sample changer, or 67-position high-capacity sample changer |
| Automation | Compatible with automation integration |
| Wavelength | Cu / Co |
|---|---|
| Tube setting | From 300 W to 600 W options in 30 kV or 40 kV setting |
| Tube housing | Patented design with Corrosion-resistant incident smart beam path technology (CRISP)
CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2 |
| Base configuration | Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal |
|---|---|
| Geometry | Bragg-Brentano, Transmission, Grazing Incidence |
| Radius | 145 mm |
| Maximum 2θ range | -4° < 2θ ≤ 142° (with scanning detector and full active length) |
| Angle positioning | Direct optical position sensing (DOPS3) with lifetime positioning accuracy |
| Scan Speed | Max 2.17°/s |
| Resolution | < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits) |
| 2θ linearity | < 0.04° 2θ |
| Smallest addressable increment | 0.001 ° |
| Spinning | Choice of spinner stages |
|---|---|
| Non-ambient | Heating stage option (BTS-500, BTS-150) |
| Exchange of stages | Alignment-free PreFIX exchange of stages |
| Special stages | On request (manual, MPSS, In-Situ) |
| Detector | Choose between the PIXcel1D, PIXcel3D and 1Der detectors |
| Dimensions | 690 x 770 x 786 mm |
|---|---|
| Dust protection | Closed system with external sample loading |
| External cooling water supply | Not needed |
| Compressed air supply | Not needed |
| Power Supply | 100 – 240 V, single phase |
| Computer | Internal instrument PC |
| Operation | Intuitive user interface with 10.4” touch screen |
| Interface | LAN, USB, HDMI |
Version number: 7
Version number: 8
Version number: 6
Version number: 7
Version number: 8
Version number: 8
Version number: 8
Version number: 2
Version number: 4
Version number: 3
Version number: 2
Version number: 4
Version number: 2
OmniTrust software update v1.7a
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
The combination of usability and performance takes your lab work to a new level.
Aeris Research Edition gives you better information and deeper insights, so you can get to the answers more effectively, refine your materials, advance your knowledge and push forward that scientific frontier.
Whatever project you are working on, the fast acquisition of phase information from your sample in question can be crucial for your research.
Just collect X-ray diffraction data with Aeris Research and subsequently employ the HighScore suite to obtain a wealth of crystallographic information.
With measurement configurations including reflection, transmission and grazing incidence X-ray diffraction (GIXRD), you have all you need to get the best data for any type of polycrystalline material.
The most intuitive X-ray diffractometer: Aeris is an easy-to-operate and user-friendly benchtop X-ray diffractometer. With its intuitive operation, Aeris makes X-ray diffraction so simple that it is accessible for everyone.
The unique touch screen user interface lets you proceed effortlessly through the measurement process of your samples. Your results are always just a few taps away:
Outperforming expectations
Aeris is your workhorse for rapid and reliable phase identification and Rietveld analysis of powder samples.
Thanks to the incorporation of technologies that have already proven their benefits on Malvern Panalytical's high-end systems, the Research edition of Aeris delivers data quality that was previously only possible with a full-size floor-standing system.
With the optional 2D detector you can teach the fundamentals of powder diffraction in a visual manner.
Aeris is very flexible and offers possibilities for all sorts of powder diffraction measurements.
The instrument can accommodate various types of sample holders in combination with a sample changer and it can be equipped with a BTS 500 Benchtop Heating Stage.
No cooling water, no chiller, no compressed air.
The only thing you need is a single-phase power socket.
The instrument is desktop, easy to use, analyzes the samples very quickly and is economic."
Sacari Sacari Elisban Juani — Universidad Nacional Jorge Basadre Grohmann
| Sample loading | External sample loading |
|---|---|
| Sample holders | Variety of full-sized sample holders capable meeting all requirements |
| Sample changing | Choose between a manual loading dock, 6-position sample changer, or 67-position high-capacity sample changer |
| Automation | Compatible with automation integration |
| Wavelength | Cu / Co |
|---|---|
| Tube setting | From 300 W to 600 W options in 30 kV or 40 kV setting |
| Tube housing | Patented design with Corrosion-resistant incident smart beam path technology (CRISP)
CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2 |
| Base configuration | Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal |
|---|---|
| Geometry | Bragg-Brentano, Transmission, Grazing Incidence |
| Radius | 145 mm |
| Maximum 2θ range | -4° < 2θ ≤ 142° (with scanning detector and full active length) |
| Angle positioning | Direct optical position sensing (DOPS3) with lifetime positioning accuracy |
| Scan Speed | Max 2.17°/s |
| Resolution | < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits) |
| 2θ linearity | < 0.04° 2θ |
| Smallest addressable increment | 0.001 ° |
| Spinning | Choice of spinner stages |
|---|---|
| Non-ambient | Heating stage option (BTS-500, BTS-150) |
| Exchange of stages | Alignment-free PreFIX exchange of stages |
| Special stages | On request (manual, MPSS, In-Situ) |
| Detector | Choose between the PIXcel1D, PIXcel3D and 1Der detectors |
| Dimensions | 690 x 770 x 786 mm |
|---|---|
| Dust protection | Closed system with external sample loading |
| External cooling water supply | Not needed |
| Compressed air supply | Not needed |
| Power Supply | 100 – 240 V, single phase |
| Computer | Internal instrument PC |
| Operation | Intuitive user interface with 10.4” touch screen |
| Interface | LAN, USB, HDMI |
Version number: 7
Version number: 8
Version number: 6
Version number: 7
Version number: 8
Version number: 8
Version number: 8
Version number: 2
Version number: 4
Version number: 3
Version number: 2
Version number: 4
Version number: 2
OmniTrust software update v1.7a
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
OmniAccess
OmniTrail
More information can be found in the Release and Installation Notes.
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
Fast high quality XRD, tailored for your requirements. Ready for automation and integration. The modern compact.