Features and benefits
Future-proof
As a modern, multi-purpose* diffractometer, Aeris’ modular design makes optional upgrades and additions a breeze – and guaranteed product availability means peace of mind for the future.
*Non-ambient, reflection, transmission, grazing incidence, 2D diffraction.
Plug-and-play simplicity
With Aeris, not every user needs XRD expertise. Its intuitive interface, pre-loaded measurement programs, and easy sample placement make reproducible great results accessible to all.
Easy, reproducible sample loading
Aeris’ precision-built sample holders and external loading system make it easy for all users to load samples correctly every time – for every sample type, from powders to solids.
Compatibility with regulated environments
With controlled user access and compliance software, Aeris is ready for all regulated workflows (according to 21 CFR Part 11 regulation). Multiple users are easily managed.
Fast and accurate
With its classic goniometer and onboard computer, Aeris’ high-performance components and precision sample stages deliver accurate results in as few as five minutes.
The future is compact
Testimonial
Great value to purchase, fast and easy to use, fantastic data; it's a winner!
Damian G. Research
Specification
Sample Handling | |
---|---|
Sample Loading | External sample loading |
Sample holders | Variety of full-sized sample holders capable meeting all requirements |
Sample changing | 6-position full-sized sample changer |
Automation | Compatible with automation integration |
X-ray Generation | |
Wavelengths | Cu or Co |
Tube setting | From 300 W to 600 W options in 30 kV or 40 kV setting |
Tube housing | Patented design with Corrosion-resistant incident smart beam path technology (CRISP)*.
*CRISP technology prevents corrosion in the incident beam path caused by X-ray induced ionized air. Patent no. US 8437451 B2. |
Goniometer | |
Configuration | Vertical goniometer, coupled and decoupled θ-θ, samples always horizontal |
Geometry | Bragg-Brentano, Transmission, Grazing Incidence |
Radius | 145 mm |
Maximum 2θ range | -4° < 2θ ≤ 142° (with scanning detector and full active length) |
Angle positioning | Direct optical position sensing (DOPS3) with lifetime positioning accuracy |
Scan Speed | Max 2.17°/s |
Achievable resolution | < 0.04° 2θ on LaB6 (with 0.01 rad Soller slits) |
2θ linearity | < 0.04° 2θ |
Smallest addressable increment | 0.001 degree |
Stages | |
Spinning | Choice of spinner stages |
Non-Ambient | Heating stage option (BTS-500, BTS-150) |
Exchange of stages | Alignment-free PreFIX exchange of stages |
Special stages | On request (manual, MPSS, In-Situ) |
Detectors | |
Detector | Choose between the PIXcel1D, PIXcel3D and 1Der detectors |
General | |
Dimensions (H x W x D) | 690 mm x 770 mm x 786 mm/ 27-inch x 30 inch x 31 inch |
Dust protection | Closed system with external sample loading |
External cooling water supply | Not needed |
Compressed air supply | Not needed |
Power supply | 100 – 240 V, single phase |
Computer | Internal instrument PC |
Operation | Intuitive user interface with 10.4” touch screen |
Interfaces | LAN, USB, HDMI |
Accessories
Software solutions
Aeris instruments and measurements are run by its onboard data collection software with preloaded measurement programs. Users can also write their own programs.
For phase quantification, amorphous content and more, the onboard RoboRiet software can perform automated analysis providing immediate on-screen viewing and transfer to results databases.
Measurement and analysis can also be automated via X’Pert Industry. Industry offers a unique scripting facility to customize data collection and calibration-line based quantification methods for any process control application. Result reporting is fully configurable also for LIMS systems.
Alternatively, you can perform your own in-depth analyses using our software packages, HighScore Plus or Stress Plus.
For regulatory compliance and data integrity, Omnitrust covers your user management and data audit requirements in a regulated environment.
RoboRiet
A special ‘execution-only’ implementation of the Rietveld method and profile fits for XRD phase quantification, amorphous quantification and more.
Industry
Software for routine X-ray diffraction analysis in an industrial environment, ranging from non-regulated to fully regulated, and from manually controlled to completely automated systems.
HighScore Plus
After identification of all phases present in your sample, this all-in-one software suite continues to support your analysis from quantification with or without the Rietveld method to profile fitting and pattern treatment.
Stress Plus
Stress Plus software is dedicated to the X-ray diffraction (XRD) analysis of residual stress in polycrystalline coatings. The software performs sin²ψ residual stress analysis using both single-directional and multi-directional techniques.
Expertise editions
Aeris makes it easy to characterise and analyze any sample across both research and industrial environments. But sometimes, your application needs a specialist solution – or you need your alternative to a benchtop xrd system to be calibrated and ready for action.
To meet this need, industry-specific, tailored editions of Aeris are also available out-of-the-box. These specialized industry versions come with customizable expertise packages, pre-calibrated for your specific analytical methods or sample material. Your Aeris will be prepared for automated measurement and analysis using the built-in Roboriet software. Ready when you are!
Find your edition below:
Aeris Research edition
Aeris Cement edition
Aeris Minerals edition
Aeris Metals edition
Aeris for pharmaceutical applications
Support
Services
Solutions to maximize the return on your investment
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Support
Service for a lifetime
- Phone and remote support
- Preventive maintenance and checkups
- Flexible Customer Care Agreements
- Performance certificates
- Hardware and software upgrades
- Local and global support
Expertise
Adding value to your processes
- Sample preparation development/optimization
- Analytical methodologies
- Turnkey solutions for XRD
- Operations via IQ/OQ/PQ, quality assurance (GLP, ISO17025) or round robins/inter laboratory studies
- Consultancy services
Training and education
- Training on-site or at our competence centers
- Broad range of basic and advanced courses on products, applications and software