XRD2DScan

Features

Analysis of 2D diffraction and scattering data

XRD2DScan enables the visualization of data recorded with the 2D PIXcel3D and PIXcel3D 2x2 detectors. 2D diffraction and scattering data contain more information compared to the 1D data in the case of textured samples or for powder samples containing larger grains, for example. Also, from 2D SAXS data it is possible to obtain information about anisotropic features of the sample.

Generation of 1D scans from 2D data

XRD2DScan can read 2D XRDML files. It supports the generation of various types of 1D scans: 2theta scans (equatorial), gamma scans (axial), line scans (in any direction), d-scan (d-value of a specific reflection as a function of the gamma angle). The scans are exported as ASCII files to be used with other programs. The 2theta scans are compatible with HighScore, HighScore Plus and EasySAXS. It is also possible to perform automatic peak finding. This provides the user with angular position and intensity of the peaks contained in a 2D diffraction pattern.

Definition of different 2D sectors and integration of the intensity

XRD2DScan supports the definition of various 2D sectors; rectangular and angular, for example. It is then possible to export 2theta scans derived from the intensities recorded in the selected sector. This is extremely useful for samples with strong texture or large grain size.

Masking of features

XRD2DScan supports feature masking in the 2D data; direct beam or strong reflections (e.g. from the substrate), for example. The user can then concentrate on only the data he wants to investigate.

Export of 2D data as images

It is possible to export the 2D data as images, to be used for presentations or publications.

Specification

Current version	7.0