Features
Analysis of coatings with increased sensitivity
A commonly used technique in X-ray diffraction analysis of randomly oriented polycrystalline coatings is to increase the sensitivity of the XRD signal by applying a grazing angle of incidence of the X-rays. In such a geometry, classical residual stress analysis is no longer possible. To overcome this limitation, Malvern Panalytical and its collaboration partner, the Max Planck Institute Stuttgart (Germany), have developed pioneering modifications to the classical sin²ψ stress analysis. Data from multiple {hkl} peaks are combined and a conversion algorithm calculates true ψ-tilts for all possible combinations of instrument angles.
Analysis of coatings with strong preferred orientation
A preferred orientation is sometimes deliberately applied to coatings in order to enhance their properties, e.g. to maximize their wear resistance. Like coatings with increased sensitivity, traditional sin²ψ stress analysis is not possible on materials with preferred orientation. Data is instead collected by applying a chi tilt to normal symmetrical scans in order to measure lattice planes, which are not parallel to the sample surface. Stress Plus allows data from different {hkl} peaks, each with their own tilt, to be combined in one modified sin²ψ plot. Stress Plus automatically accounts for peak shifts due to stress, assigning correct Miller indices and identifying coating and substrate or sub-layer peaks.
Easy to set up and use
Residual stress measurements on coatings are fully supported in both Data Collector and Stress Plus. Data Collector contains special measurement programs to set up the data collection strategy. Stress Plus takes all parameters from the .XRDML file and generates the residual stress values in the same intuitive way as the Stress program.
Experimental freedom
Stress Plus calculates all intermediate results and final stress data instantly. The influence of all parameters is directly reflected in the final result. The option to analyze combined data sets from multiple data files provides complete experimental freedom. Additional data can be added at any time. User-configurable defaults and instant recalculation of results based on a change of input parameters, make Stress Plus ideal for both routine analysis and research applications.
User documentation
Our Quick Start Guide provides all the information you need to get up and running with Stress Plus.
Specification
Measurement systems
The following systems can be used for collecting and storing stress data:
- Empyrean with Data Collector 4.0 and higher
- X’Pert PRO with X’Pert Data Collector 1.3 or 2.0 and higher
- X’Pert³ with the latest version of Data Collector 4.3 and higher
Recommended system configuration
Designed for and running on Windows 8.1 (64-bit) and Windows 10 (64-bit) Current Branch for Business operating systems.
A PC configuration matching the (minimum) hardware requirements for the desired Windows operation system will be sufficient.
| Current version | 3.0 |
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