| 00:00:00 | Welcome |
| 00:00:13 | Introduction |
| 00:01:40 | A comparison of sieves and laser diffraction for particle size analysis |
| 00:02:44 | Abstract |
| 00:03:33 | Outline |
| 00:04:25 | They’re not the same are they? |
| 00:06:37 | Sieves – factors that play a role |
| 00:08:01 | Diffraction – factors that play a role |
| 00:09:00 | Grizzly Isle of Mull January 1999 |
| 00:09:47 | All retained particles are considered the same (> 1”) |
| 00:10:54 | Sieves |
| 00:11:51 | Sieves |
| 00:11:56 | Why laser diffraction? |
| 00:14:30 | Laser diffraction – what are we measuring? |
| 00:15:25 | Measurement principle |
| 00:16:52 | Untitled |
| 00:16:57 | Halo around moon http://apod.nasa.gov/apod/ap030421.html |
| 00:17:33 | Size of droplets |
| 00:18:52 | Laser diffraction - disadvantages? |
| 00:18:57 | Variation of scattering angle with particle size |
| 00:20:14 | Iteration - the fit |
| 00:21:11 | Shape and laser diffraction |
| 00:23:23 | Laser diffraction and screen - resolution |
| 00:25:06 | Extremes of distributions |
| 00:26:40 | Continuous – discontinuous Sieve display as histogram! |
| 00:27:19 | Continuous – discontinuous Laser diffraction display as histogram |
| 00:28:19 | x100 – ISO13320:2009 |
| 00:28:54 | Sieving - a common question |
| 00:29:36 | Sieving - a common question – 100 mm cubeSquare mesh screen |
| 00:30:58 | This particle will also pass the screen |
| 00:32:12 | Sieving – 100 mm cube particle twice the densitySquare mesh screen |
| 00:33:08 | Maximum dimension of a unit cube |
| 00:33:31 | What will/may a square screen pass? |
| 00:34:13 | Sieving - a common question |
| 00:34:44 | Sieving – shape dependence |
| 00:35:28 | Circular holes? |
| 00:35:50 | Sieves: calibration and verification |
| 00:36:50 | Cement (from NIST SP260-176) |
| 00:37:30 | Laser diffraction: calibration and verification |
| 00:38:42 | Cement |
| 00:39:00 | Sieves – resolution |
| 00:39:29 | Sieves - tolerance |
| 00:41:01 | In case you think that this is old and outdated.. |
| 00:41:06 | NBS-1003cMeasured by sieves, diffraction and EZS |
| 00:42:09 | NBS-1003cMeasured by sieves, diffraction and EZS |
| 00:42:23 | NBS-1003cSieves – reproducibility - statistics – AFR calculations |
| 00:43:07 | NBS-1003cLaser diffraction – reproducibility - statistics – AFR calculations |
| 00:43:41 | Comparison of techniques – buyer beware! |
| 00:45:50 | Powder coatingFinal sieve set to 100mm2-bar pressure |
| 00:46:15 | Powder coatingFinal sieve set to 150mm1.5-bar pressure |
| 00:46:52 | Sieves - Ibuprofen |
| 00:47:07 | Sieves - Ibuprofen |
| 00:47:33 | Sieves - Ibuprofen |
| 00:48:02 | Sieving |
| 00:48:29 | So where did that quote really originate? |
| 00:49:13 | AIME March 1907 No 14 |
| 00:50:03 | Notoriously inaccurate method |
| 00:50:43 | Route forward |
| 00:52:57 | Useful references |
| 00:53:03 | Past webinar |
| 00:53:28 | Thank you! |
| 00:53:46 | Thank you for your attentionAny questions? |
| 00:59:37 | Contact Information |
In this presentation, we explore the practical aspects of sieving method – the advantages and disadvantages. We will also compare the method to other techniques such as laser diffraction indicating the increased wealth of information that can be obtained with these more modern instrumental techniques.
Vortragende
Dr. Alan Rawle has more than a quarter of a century’s experience in various aspects of technology. He started his academic life in industrial chemistry gaining a Ph.D in supported alloy catalysts where colloidal sized material was the norm. After a career in liquid crystal displays engineering he moved onto technology transfer and thence on to electro-optics, lasers, signal processing and ultimately particle sizing characterization techniques. He has spent many years working on the ISO TC24/SC4 (Particles Sizing techniques excluding sieving) committee which has been responsible for such standards as ISO 13320-1 dealing with laser diffraction and ISO 13321 dealing with photon correlation spectroscopy. He is the Convener of WG10, Small Angle X-Ray Scattering Methods. After his move across the pond from the U.K. to the U.S.A., he has also become involved in ASTM activities. He is currently CoChair of E 56.02, the Characterization SubCommittee of the ASTM E56 Committee on Nanotechnology and is also a member of 3 other ASTM committees. He and his team are involved in supporting Malvern Instruments’ customers worldwide.
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Why attend?
To gain an insight into some of the common pitfalls and assumptions of the screening technique, the limited information generated by sieves, and an understanding of the differences when compared to other techniques.
Who should attend?
Anyone who is sadly tasked with having to effect comparisons of screens with other data and is (perhaps) having to bend one set of data to fit another.
What will you learn?
About the differences and potential benefits of laser diffraction compared with sieve analysis and a suggested strategy for peaceful coexistence of both techniques.
To gain an insight into some of the common pitfalls and assumptions of the screening technique, the limited information generated by sieves, and an understanding of the differences when compared to other techniques.
Who should attend?
Anyone who is sadly tasked with having to effect comparisons of screens with other data and is (perhaps) having to bend one set of data to fit another.
What will you learn?
About the differences and potential benefits of laser diffraction compared with sieve analysis and a suggested strategy for peaceful coexistence of both techniques.