Put Aeris to the test: the measurement of thin film and small amounts of organic powders

The analysis of thin film samples and coatings as well as of small amounts of X-ray transparent organic powders has proven elusive for most benchtop XRD systems. But not so for the next generation Aeris. The Aeris X-ray diffractometer features all necessary optical elements and movements necessary to handle these challenging types of samples. All are based on our trusted and proven PreFIX concept. Exchanges are performed within a minute and no realignment of any part is required.

First, watch our Application Specialist Dr. Martin Schreyer measure a thin film sample in traditional reflection geometry. Right after, observe how the instrument is reconfigured for a grazing incidence XRD (GIXRD) scan in barely a minute. See for yourself how the new set-up enables the Aeris to perform a GIXRD scan and how this enables your laboratory to investigate your thin-film or coating samples.

In the next step, the diffractometer will be configured for transmission measurements in less than a minute. We will demonstrate how to prepare a small amount of organic powder and measure it in transmission. Conventionally, such powders are prepared on 0-Background holders. In this case, peak intensities are distorted by either preferred orientation or particle statistics and peak positions are prone to sample displacement. Sometimes this makes even the most basic sample analysis challenging. However, transmission measurements on the Aeris will provide powder diffractograms with highly reproducible and accurate peak positions and intensities at an attractive speed. Just what you need for thorough data analysis. Your samples are air-sensitive? Filling them into a glass capillary and sealing them inside will protect them from air and moisture much better than any other solution.

You will see that the Aeris compact diffractometer is just what you were missing in your lab.