![](https://p3.aprimocdn.net/malvernpanalytical/76af14a9-c83c-463b-8630-ad9e00d9d1d3/636378849169869879UO_Original%20file.jpg?quality=60&height=200)
X'Pert³ MRD
La nouvelle génération de diffractomètres polyvalents pour la recherche en matériaux
- Mesure
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Reciprocal space analysis
Texture analysis
Epitaxy analysis
Interface roughness
Residual stress
Thin film metrology
Phase quantification
Phase identification
- Accuracy
- 1% (non-condensing)
- Technologie
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X-ray Diffraction (XRD)