Crystal Orientation: Unlocking Precision with SDCOM

par Jürgen Alizoti, Tuesday, 15th October 2024

Crystal Orientation is a key factor which influences the physical and chemical properties of crystalline materials. As such, controlling the crystal orientation can significantly enhance performance and reliability of your materials. One of the systems used to measure and analyse crystal orientation is the SDCOM (Smart Diffractometer for Crystal Orientation Measurements)

In this blog, we will define the concept of crystal orientation, its importance in various industries and how the SDCOM is able to perform such measurements.

What is Crystal Orientation?

A crystal is a repeating pattern of atoms, and the crystal orientation refers to the arrangement of atoms in a crystal lattice along specific directions. Their alignment directions can affect how the material behaves mechanically, electrically, thermally and optically.

Miller indices typically denote the orientation of specific atomic planes within the crystal. Different indices lead to varying properties, even when considering the same material.

Si (100) and Si (111) Orientation: These Miller indices represent different planes in crystals, where (100) is commonly used in silicon wafer production while (111) is often preferred in applications that require better electron mobility or mechanical strength.

Understanding and controlling these orientations, allow manufacturers to optimize material performance for specific applications. In Semiconductor industry, the orientation of silicon wafers directly affects their performance in electronic devices, with some orientations suited for specific fabrication processes like etching while some other orientations improve electron mobility.

What is SDCOM ?

SDCOM (Smart Diffractometer for Crystal Orientation Measurements) is an ultra-fast, top surface measuring crystal orientation system, in a compact package. It is able to measure any single crystal with a diameter between 2mm and 300mm, using the azimuthal scan method to precisely determine complete lattice orientation of single crystals in just one rotation.

How does it work and what are SDCOM’s Features and Benefits?

It is a fast and precise measurement thanks to the azimuthal scan method. This method requires only one measuring rotation to gather all the necessary data and fully determine the orientation. The sample is rotated 360⁰, with the X-ray source and detector positioned to achieve a certain number of reflections per turn. These reflections enable the orientation of the crystal lattice to be measured in relation to the rotation axis with a high precision of up to 0,01⁰.
It offers flexibility due to its range of measurements, whether that is a sample of 2mm or 300mm, or the materials it can analyze such as Si, SiC, GaN, GaAs, Ag, MgF₂ and any other single crystalline material.
It comes with a variety of sample holders and transfer fixtures to further expand the possibilities of the SDCOM’s applications.
It is a cost-effective solution due to its lightweight, compact shape but also the air cooling that is used for the X-ray tube. Its energy consumption is kept to a minimum while being easily integrable in research or industry processes.

Conclusion

Crystal orientation plays a pivotal role in determining the physical properties and performance of materials across industries. The SDCOM is a cutting-edge tool that enhances the precision of crystal orientation measurements through advanced X-ray diffraction techniques. With its high accuracy, non-destructive testing capabilities, and fast analysis times, SDCOM is an essential part of the toolkit for semiconductor researchers and manufacturers

By leveraging SDCOM, companies can achieve better product performance, reduced waste and cost, and improved process efficiency—key drivers in today’s competitive industrial landscape.

Further reading

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