Introduction to Wavelength Dispersive Spectroscopy WDXRF & Malvern Panalytical WDXRF Spectrometers
X-ray fluorescence (XRF) spectrometry is a non-destructive analytical technique used to obtain elemental information from different types of materials.
It is employed in many industries and applications including: cement production, glass production, mining, mineral beneficiation, iron, steel and non-ferrous metals, petroleum and petrochemicals, polymers and related industries, pharmaceuticals, healthcare products and environmental.
Spectrometer systems are generally divided into two main groups: wavelength dispersive systems (WDXRF) and energy dispersive systems (EDXRF). The difference between the two lies in the detection system.
The basic concept of all spectrometers is a radiation source, a sample and a detection system. In WDXRF spectrometers, the X-ray tube acting as a source irradiates a sample directly, and the fluorescence coming from the sample is measured with a wavelength dispersive detection system.
The characteristic radiation coming from each individual element can be identified using analyzing crystals which separate the X-rays based on their wavelength, or conversely their energies.
Such an analysis can either be done by measuring the X-ray intensity at different wavelengths one after the other (sequential) or in fixed positions, measuring the X-ray intensities at different wavelengths all at the same time (simultaneous).
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