High-Throughput Crystal Orientation with the Wafer XRD 200
Introduction
Malvern Panalytical’s Wafer XRD 200 redefines efficiency in the wafer’s crystal orientation. In our latest video, Dirk Kok, Application Specialist, explains how this advanced diffractometer combines speed, accuracy, and versatility to meet the demands of high-volume semiconductor manufacturers.
What Does the Wafer XRD 200 Do?
The Wafer XRD 200 is a high-throughput crystal orientation diffractometer designed for wafer production. It determines the crystal orientation, including tilts and lateral directions, while using optical sensors to assess wafer shape, diameter, and flatness or notches. It also identifies wafer IDs and it can also check for cracks, ensuring the wafers meet production standards.
Unmatched Speed and Throughput
With the ability to process a full cassette of 25 wafers in just 10 minutes, the Wafer XRD 200 delivers industry-leading throughput. This makes it possible for large fabs to measure up to one million wafers annually, enabling comprehensive quality control without sacrificing speed.
What Sets the Wafer XRD 200 Apart?
In one sentence: the Wafer XRD 200 offers maximum throughput, performing detailed analysis of a full cassette in record time, ensuring reliability for high-volume operations.
Discover how the Wafer XRD 200 can transform your production process by visiting our website or watching the full video on our YouTube channel.
Learn more about Wafer XRD 200 here.
Further reading
- Unveiling crystal clarity: A recap of our introduction to crystal orientation webinar
- Wafer technology webinar covering all steps from seed to ingot to wafer!
- Revolutionizing SiC Manufacturing With Advanced Crystal Orientation Measurement Systems
- Revolutionizing Crystal Orientation with Omega/Theta: Faster, precise, and ready for production
- Crystal Orientation: Unlocking Precision with SDCOM