This datasheet demonstrates that the Epsilon 5 XRF spectrometer provides the ideal solution for the quantification of Ag in ore materials.
Epsilon 5 combines a high kV X-ray source, polarizing optical path and a wide range of secondary targets to optimize the analysis of heavy elements at trace levels. In particular, the choice of several secondary targets also allows the optimal excitation of Ag while providing a simple means of matrix correction by ratioing the analyte lines to the Compton scatter peaks from the secondary targets.
