Thin films analysis, XRD data analysis and other orthogonal methods like particle size characterization

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Malvern Panalytical is proud to collaborate with IIT Jammu in this 2 day free workshop. Malvern Panalytical scientists as well as invited guest speakers from renowned universities within India will not share their research but also experience. The focus is on batterynanomaterialsthin film coating applications. They will discuss their research applications, data analysis and implications. The characterization methods covered will include phase analysis using X-ray diffraction, nanoparticle analysis using small angle X-ray scattering(SAXS) and particle size analysis using Laser diffraction.

Each participant who participates for the 2 full day workshop will receive a:

  • certificate of attendance
  • free trial version of the latest version of HighScore Plus XRD software by Malvern Panalytical (v5.0)

Watch the recordings of the workshop

  • Day 1 morning: battery research applications. Click here
  • Day 1 afternoon: XRD data analysis on HighScore Plus software. Click here
  • Day 1 afternoon: XRD experiments on the intelligent multi-purpose X-ray diffractometer, Empyrean. Click here
  • Day 2 morning: Thin films analysis, XRD data analysis and other orthogonal methods like particle size characterization
  • Day 2 afternoon: Nanomaterials characterization using SAXS and non-ambient XRD research. Click here