To optimize the chemical composition of the final cathode materials, it is first essential to control the chemical composition of the precursor and raw materials. X-ray fluorescence (XRF) analysis, which can characterize chemical composition and impurities from just a few ppm all the way up to 100%, is the best technique for controlling this parameter.
Specifically, XRF provides a simpler and more accurate way of measuring elemental composition than inductively coupled plasma (ICP) mass spectrometry, as it does not require any sample dilution or acid digestion.
Malvern Panalytical specialists have developed a turn-key solution, including certified reference materials (CRMs) and calibration templates, for the analysis of both precursor and cathode material composition with the benchtop Epsilon 4 EDXRF or floor-standing Zetium WDXRF spectrometers.
Présentateur
- Alexander Komelkov - Application Specialist, Malvern Panalytical
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Who should attend?
- Research & development
- Quality control
- Laboratory managers and analysts
What will you learn?
- XRF analysis of solutions containing Ni, Co, and Mn
- NCM-certified reference materials for XRF calibration purposes
- Turn-key solution for the XRF analysis of NCM precursors and cathodes