2830 ZT 预安装手册
Version number: 4
2830 ZT
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer measures film thickness and composition.
Download brochure
User manuals
2830 ZT Pre-installation manual
Version number: 4
2830 ZT User Guide
Version number: 2
Software downloads
Please contact support for the latest software version.
Events and training
All events
Malvern Panalytical Future Days: Focus On Semiconductor
- Products:
- Crystal orientation range, 2830 ZT, X'Pert3 range
- Technology:
- X-ray Fluorescence (XRF), Dynamic Light Scattering, Wavelength Dispersive X-ray Fluorescence (WDXRF), X-ray Diffraction (XRD)
- Industry:
- Semiconductor/Electronics
Elemental Analysis Masterclass 3 - The Basics of Sample Preparation for XRF
- Products:
- 2830 ZT, Axios FAST, Claisse range, Epsilon range, CNA range, Zetium
- Technology:
- X-ray Fluorescence (XRF), Borate fusion