Data Collector
Data Collector is your control board for all measurements on powders, thin films, nanomaterials and solid objects.
Our XRD software packages are designed to extract every bit of information from your material.
We offer intuitive data collection software tailored to research or process control use, and state-of-the-art analysis modules for the many XRD applications possible on our instruments.
Data collection software for multipurpose diffractometers
With these software modules, you can unleash all functionality on your multipurpose Empyrean, X’Pert³ Powder or X’Pert³ MRD.
Data Collector is the central data acquisition software toolbox for Empyrean, X’Pert³ MRD (XL) and X’Pert³ Powder. XRD2DScan offers easy conversion of 2D datasets to 1D traces for further analysis.
XRD2DScan
Visualize your 2D diffraction data and convert it to various 1D scans with XRD2DScan.
Software for powder diffraction process control applications
Control your CubiX³ or X’Pert³ Powder for powder diffraction measurements and extract calibration-line based quantitative results.
Industry is designed for industrial environments with push-button interface and extensive LIMS and automation capabilities. With the optional Walk-up Interface, multi-user environments are well supported. Quantify is a simplified version with 10 preprogrammed quantitative analysis modules.
Powder diffraction software modules
Our HighScore family of powder diffraction software is designed to extract all phase information from your loose and pressed powders and other polycrystalline samples.
Learn more about the world’s most advanced search-match software HighScore, with its extensive support of various search-match databases like CanDI-X. The HighScore Plus option offers additional routines for crystallography, unlimited clustering and Rietveld analysis on top of all HighScore functionality. RoboRiet offers ‘execution-only’ Rietveld quantification and profile fits for industrial environments.
HighScore
HighScore, our powder diffraction software, can also be used for phase identification and depth profiling of phases in polycrystalline coatings.
HighScore Plus
On top of HighScore, our Plus option adds crystallographic, unlimited clustering, Rietveld /structure fits and more under the same user interface.
Search-match
We support the widest variety of search-match databases for the ultimate performance in phase identification.
RoboRiet
RoboRiet is a special ‘execution-only’ implementation of the Rietveld method and profile fits for industrial environments.
XRD analysis of thin films
With our thin film software modules, you can obtain detailed information on the thickness, composition, preferred orientation, epitaxial quality and residual stress present in layers.
These essential thin layer parameters are easily and quickly quantified with the new, all-in-one, AMASS (Advanced Material Analysis and Simulation Software) suite.
For polycrystalline layers and layer stacks, you can determine the phase composition, also as a function of depth, with our HighScore software, and determine the residual stresses with our Stress Plus software.
AMASS
Our AMASS software suite offers all the functionalities you need to characterize your layered structures enabling fast and easy determination of key thin-film parameters.
Stress Plus
With our Stress Plus module on top of our Stress software package, residual stresses in polycrystalline films can be determined.
Size and shape analysis of nanomaterials
EasySAXS data analysis software for nanoparticle and nanostructure analysis. It provides information on nanoscale structures and dimensions, nanoparticle shapes and surface areas.
The software also supports the analysis of ultra-small-angle X-ray scattering (USAXS) data.
EasySAXS 2.2
EasySAXS is an advanced, user-friendly software package for the analysis of small-angle X-ray scattering (SAXS) data.
Analysis of solid objects
Our Texture and Stress software modules reveal the preferred orientation and residual stresses present in your machined components like rolled and extruded metals.
Stress is praised by experts worldwide for its extensive yet intuitive functionality. The optional module Stress Plus adds analysis of residual stress in thin films to the Stress package.
Texture offers extensive functionality for analyzing pole figures, orientation distribution functions (ODFs) and inverse pole figures.
Stress analysis
Our intuitive Stress package calculates residual stresses in your samples using the sin2Ψ method.
Stress Plus
With the Stress Plus option, you extend the functionality of your Stress software to the analysis of polycrystalline and thin films.
Texture
Texture is our software package enabling you to analyze, calculate and visualize preferred crystallite orientations.