(This webinar will be conducted in Mandarin)
In recent years, materials such as ZnO and GaN have become integral towards various thin film applications. For instance, solar energy conversion, piezoelectric nanogeneration (for wearable devices) as a photocatalyst and more. To optimise the performance of the material, whether its properties for storage, electrical conductivity etc, it is critical that researchers gain a deeper understanding of its structural characterisation by way of X-ray diffraction.
We invite you to gain a deeper understanding of thin film materials research during our free workshop. We have specially invited guest speakers from our supply center in the Netherlands as well as our application specialist in Taiwan with many years of experience working in the semiconductor industry. They will be discussing the latest applications as well as latest X-ray diffractometers on hand to support your research. Look forward to practical case studies to aid the interpretation of peak displacement, peak broadening or peak overlap with advanced methodologies RSM or reciprocal space mapping. See how Malvern Panalytical now brings this to the next level with URSM for ultra-fast reciprocal space mapping, where data can now be collected in as little as 30 seconds.
Interested to learn more? Scroll down to register your interest in our series of specialty chemicals and related webinars.
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免費的線上直播workshop：薄膜分析(中文進行)
深入了解XRD最新的應用，包括超高速倒異空間圖譜分析技術 (URSM)
近年來，氧化鋅(ZnO)和氮化鎵(GaN)等材料已成為各種薄膜應用上不可或缺的組成物料，例如，在太陽能轉換和壓電奈米發電（用於穿戴式裝置）上作為光催化劑，為了優化材料的性能(無論是材料的儲存能力或導電率等)，對研究人員來說，通過X光繞射對其結構特徵加深了解是非常重要的。
誠摯地邀請您參加此研習會，加深對薄膜材料研究的了解，我們特別邀請了來自荷蘭研究中心以及來自台灣有著多年半導體工作經驗的應用專家，講者將討論最新的應用和最新的X光繞射儀，來幫助您的研究，我們期待能與您進行實際案例研究，以進階方法-倒異空間圖譜分析技術(RSM)，解釋繞射峰位移(peak displacement)、繞射峰寬化(peak broadening) 或繞射峰重疊(peak overlap)。這次我們將帶您了解Malvern Panalytical現在如何通過URSM將研究帶入另一個新的高度，使用超高速倒異空間圖譜分析技術，可以在30秒內完成數據收集。
Join our free series of webinars:
- Webinar 1: Optimizing the whiteness and brightness of titanium dioxide and other pigments for your paints, pigments, plastics using particle size & XRD (Mandarin). More info
- Webinar 2: XRD phase quantification tutorial - crystallinity calculation of amorphous samples. More info
- Webinar 3: Introduction to nano particle size distribution analysis and zeta potential using dynamic light scattering. More info
- Webinar 4: Introduction to particle size distribution analysis using laser diffraction. More info
- Webinar 5: Free online workshop: Thin film research for battery, semiconductor, solar cell research (Mandarin)
Speakers
Dr Bao ZhaoHui(鲍朝辉), Senior X-ray Diffraction, Applications Specialist at Malvern Panalytical
Dr Bao has been working at Malvern Panalytical's supply center in the Netherlands for more than 7 years. His specialty is in X-ray diffraction, which can be to uniquely identify and quantify materials based on their crystal structure or to check for phase changes or the integrity or performance of the material under pressure, temperature, humidity changes. ZhaoHui completed his PhD in Materials Science at the Instiut National Polytechnice de Grenoble, France. He carried out his PhD fellowship at the European Commission in Germany where he focused on developing and characterising epitaxial oxide thin films. Today, Dr Bao shares his knowledge with clients who want to expand their research or industrial applications using XRD. This is through guest speaking at conferences and online seminars as well as product demonstrations.
FAQ
Who should attend:
1. Researchers, laboratory managers, quality control managers
2. Anyone working within semiconductors, electronics, wafer fabrication, battery, solar cells and other thin film applications
3. Academia who are interested in expanded their XRD capabilities
誰應該參加：
1. 研究人員、實驗室經理、品質控制經理
2. 從事半導體、電子、晶片製造、電池、太陽能電池和其他薄膜應用領域的人員
3. 對擴展其XRD功能感興趣的學術界
How long is this webinar?
1hr