| 00:00:00 | Introduction to X-ray powder diffractometry: |
| 00:03:06 | Objective |
| 00:04:20 | downloads |
| 00:05:14 | Common optics for x-ray powder diffraction |
| 00:05:22 | Why do we need optics for XRPD? |
| 00:07:25 | Why do we need optics for XRPD? |
| 00:10:50 | Soller Slits reduce axial divergence |
| 00:13:43 | Divergence Slits limit equatorial divergence |
| 00:17:29 | Other slits and optics |
| 00:19:06 | Why do we need optics for XRPD? |
| 00:20:26 | Beta-filter |
| 00:21:34 | Monochromator |
| 00:23:25 | Incident-beam prefix modules |
| 00:25:53 | Incident-beam prefix modules |
| 00:26:54 | Detectors |
| 00:27:09 | Criteria for accurate xrpd data |
| 00:27:16 | Collecting accurate data |
| 00:28:41 | Anode type |
| 00:30:29 | Anode Type |
| 00:31:03 | Anode type |
| 00:31:25 | Anode type |
| 00:33:36 | Sample fluorescence |
| 00:35:28 | Instrument configuration criteria |
| 00:36:47 | Instrument configuration criteria |
| 00:37:28 | X-ray penetration depth |
| 00:38:36 | Video 1 |
| 00:38:36 | X-ray penetration depth |
| 00:40:05 | Instrument configuration |
| 00:41:33 | Instrument configuration |
| 00:41:44 | Instrument configuration criteria |
| 00:41:54 | Instrument configuration criteria |
| 00:42:05 | Video 2 |
| 00:42:05 | Instrument parameters for accurate data |
| 00:42:30 | Instrument parameters for accurate data |
| 00:43:18 | Instrument parameters for accurate data |
| 00:45:09 | Instrument parameters for accurate data |
| 00:46:42 | Instrument alignment |
| 00:47:23 | Optimizing measurement parameters |
| 00:47:31 | Measurement parameters |
| 00:47:43 | Program type |
| 00:47:49 | Video 3 |
| 00:47:49 | Scan types (Scan axis) |
| 00:49:41 | Measurement parameters |
| 00:50:30 | Step size |
| 00:51:58 | Step size |
| 00:52:52 | Step size |
| 00:54:58 | Scan rate |
| 00:58:00 | Scan rate |
| 00:59:17 | Scan Rate |
| 01:00:02 | Scan Rate |
| 01:00:24 | Video 4 |
| 01:00:24 | Scan Rate |
| 01:01:31 | Scan repetition |
| 01:03:56 | Video 5 |
| 01:03:56 | Improving crystallite statistics |
| 01:04:53 | Improving crystallite statistics |
| 01:05:29 | Video 6 |
| 01:05:29 | Improving crystallite statistics |
| 01:06:39 | Concerns and recommendations for various sample types |
| 01:06:55 | Want to know more? |
| 01:07:43 | Appendix A:illustrated reference guide for Prefix modules |
| 01:07:57 | Question & Answer SessionUse the Q & A icon and type your question.If listening on demand send your questions to: events@malvernpanalytical.comThank you for attending |
X-ray Powder Diffractometers are versatile instruments that often come with a variety of optics and accessories that can be exchanged to optimize measurements. While these options provide flexibility, they can also leave one unsure about the best configuration to use. This presentation will teach ways to navigate all of the choices and select the best configuration and measurement parameters to collect powder diffraction data from a variety of samples.
This presentation will:
- review the common optics used for X-ray powder diffraction and discuss their impact on data quality;
- discuss how configuration affects resolution, intensity, beam size, etc;
- identify the most critical criteria for collecting accurate data;
- discuss how different sample types (clinker, mining, chemical, pharmaceutical, advanced materials) place different requirements on measurements;
- discuss strategies for optimizing measurement parameters.
Speakers
Scott Speakman, XRD Principal Scientist at Malvern Panalytical
More information
Why attend?
Attendees will leave with practical knowledge on selecting the optimal instrument set up to obtain the best data for a certain type of sample.
What will you learn?
XRD system components and their purposes and affects on the quality of data. Strategies for best setups for given sample types. As a bonus they will be able to download a chart from the presenter that makes setting up experiments for different samples effortless.