As layers of pure metals or alloys are used to enhance certain features of a product, it is important to precisely and accurately determine coating thickness. Quality control of metal coatings requires non-destructive, metal analysis as well as detailed characterization of physical properties. X-ray fluorescence (XRF), particle shape analysis and X-ray diffraction (XRD) are non-destructive, non-contact analytical techniques that require little or no sample preparation, making them ideal for this application.
Typical applications include:
Morphologi rangeAutomated imaging for advanced particle characterization |
EmpyreanThe intelligent diffractometer |
The Metals edition of ZetiumThe new element in metals |
Epsilon rangeFast and accurate at- and on-line elemental analysis |
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Technology | ||||
Image analysis | ||||
X-ray Diffraction (XRD) | ||||
Wavelength Dispersive X-ray Fluorescence (WDXRF) | ||||
Energy Dispersive X-ray Fluorescence (EDXRF) | ||||
X-ray Fluorescence (XRF) |