Aeris
Prepare to be surprised by our highly accurate, fast XRD system. Precise results can be ready in less than five minutes.
Download the brochure - In-operando XRD battery research and quality control solutions. Download now
Download nowCompact & floorstanding XRD solutions
X-ray diffractometers are designed for obtaining the ultimate quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications.
Malvern Panalytical's X-ray diffraction (XRD) solutions are used in many environments, from universities and research institutes to industrial process control labs. Whatever your need, we offer the right diffractometer, backed up by our worldwide sales and service organization. For our x-ray diffractometer prices, please contact sales.
Our multipurpose diffractometers, Aeris, Empyrean and X’Pert3 MRD (XL), are all equipped with PreFIX (pre-aligned, fast interchangeable X-ray) modules, making a change in the optical path effortless for the user. For this reason, we offer the most applications on a single diffractometer platform.
Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind.
Our range of crystal orientation solutions are designed with ingot, wafer and crystal applications in mind.
Crystal orientation is made simple in a range of environments with our instruments - from on-line analysis to desktop research, we have you covered.
AerisThe future is compact |
Empyrean rangeMultipurpose X-ray diffractometers for your analytical needs |
X'Pert³The improved X’Pert platform |
Crystal orientation rangeFast and accurate orientation of wafers, boules and any other single crystalline samples |
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| Technology | ||||
| X-ray Diffraction (XRD) | ||||
| Measurement type | ||||
| Particle shape | ||||
| Particle size | ||||
| Crystal structure determination | ||||
| Phase identification | ||||
| Phase quantification | ||||
| Contaminant detection and analysis | ||||
| Epitaxy analysis | ||||
| Interface roughness | ||||
| 3D structure / imaging | ||||
| Thin film metrology | ||||
| Residual stress | ||||
| Crystal orientation | ||||
| Cleanroom ISO 4 | ||||
| SECS/GEM | ||||