DDCOM
Ultra-fast, bottom surface measuring crystal orientation in a compact package
- Measurement
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Crystal structure determination
- Technology
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X-ray Diffraction (XRD)
Fast and accurate orientation of wafers, boules and any other single crystalline samples
Our Crystal Orientation solutions are designed with boule, ingot, puck and wafer applications in mind. Our products offer simple, ultra-fast crystal orientation in a range of environments.
From fully automated on-line analysis to quick quality checks, we have you covered.
