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Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Full in-line automation: Enjoy continuous R2R production thanks to seamless integration capabilities, suitable for a range of thin-film and coating applications.
Simple and safe: fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
A lifetime of experience: Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today, and at the same time looking to the industry’s future together.
Maximized yield: Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
Optimum materials efficiency: Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
Proven, patented accuracy: Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
With platinum catalysts accounting for more than 20% of your overall fuel cell costs, optimizing catalyst coating through uniform dispersion and consistent layering is essential. And fast, accurate process monitoring is the ideal solution! The Epsilon Xline makes efficient operational control easy, helping you to:
X-ray fluorescence (XRF) is a non-destructive elemental analysis technology that enables in-line monitoring during the coating processes of catalytic membranes – without the need to take samples and without chemical or physical changes.
The resulting real-time in-line analysis enables the rapid optimization of many process parameters and product properties.
The proven and robust technology used in the Epsilon Xline and throughout our series of Epsilon instruments is powered by the latest advances in excitation and detection technology.
A well-designed optical path, a wide range of excitation capabilities for light and heavier elements, and a fast high-resolution SDD detector system contribute to the power of the Epsilon Xline. These innovations result in highly repeatable and accurate results with low maintenance.
| Sample types | Coating line |
|---|---|
| Coating types | Continuous, lanes, patches |
| Line speed continuous coating | Maximum 30 m/min |
| Line speed patch coating | Maximum 11 m/min
|
| Type | Metal-ceramic, 50 µm (Be) side window |
|---|---|
| Anode material | Ag |
| Tube setting | Software controlled, applicable voltages 4 - 50 kV, max. 3 mA, max. tube power 15 W |
| X-Ray filtering | Six, software selectable (Cu 300 µm; Cu 500 µm; Al 50 µm; Al 200 µm; Ti 7 µm; Ag 100 µm |
| Type | High-resolution Si drift detector SDD10
Window: 8 µm (Be) |
|---|---|
| Resolution | < 145 eV @ 5.9 keV/1000 cps
Typically 135 eV @ 5.9 keV/1000 cps |
| Radiation levels | < 1 µSv/h at 10 cm of the outside surface |
|---|
Integrate the Epsilon Xline into your production lines seamlessly with built-in OPC connectivity. The dedicated software package included makes it simple to set up your Epsilon Xline for different materials and measurement modes. By entering commands directly into the instrument – or via a remote console – the easy-to-use interface displays an overview of complete tracking data.
Analytical EDXRF software package for Epsilon benchtop systems
Determination of composition and thickness of coatings and multi-layers
Please contact support for the latest user manuals.
Please contact support for the latest software version.
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Full in-line automation: Enjoy continuous R2R production thanks to seamless integration capabilities, suitable for a range of thin-film and coating applications.
Simple and safe: fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
A lifetime of experience: Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today, and at the same time looking to the industry’s future together.
Maximized yield: Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
Optimum materials efficiency: Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
Proven, patented accuracy: Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
With platinum catalysts accounting for more than 20% of your overall fuel cell costs, optimizing catalyst coating through uniform dispersion and consistent layering is essential. And fast, accurate process monitoring is the ideal solution! The Epsilon Xline makes efficient operational control easy, helping you to:
X-ray fluorescence (XRF) is a non-destructive elemental analysis technology that enables in-line monitoring during the coating processes of catalytic membranes – without the need to take samples and without chemical or physical changes.
The resulting real-time in-line analysis enables the rapid optimization of many process parameters and product properties.
The proven and robust technology used in the Epsilon Xline and throughout our series of Epsilon instruments is powered by the latest advances in excitation and detection technology.
A well-designed optical path, a wide range of excitation capabilities for light and heavier elements, and a fast high-resolution SDD detector system contribute to the power of the Epsilon Xline. These innovations result in highly repeatable and accurate results with low maintenance.
| Sample types | Coating line |
|---|---|
| Coating types | Continuous, lanes, patches |
| Line speed continuous coating | Maximum 30 m/min |
| Line speed patch coating | Maximum 11 m/min
|
| Type | Metal-ceramic, 50 µm (Be) side window |
|---|---|
| Anode material | Ag |
| Tube setting | Software controlled, applicable voltages 4 - 50 kV, max. 3 mA, max. tube power 15 W |
| X-Ray filtering | Six, software selectable (Cu 300 µm; Cu 500 µm; Al 50 µm; Al 200 µm; Ti 7 µm; Ag 100 µm |
| Type | High-resolution Si drift detector SDD10
Window: 8 µm (Be) |
|---|---|
| Resolution | < 145 eV @ 5.9 keV/1000 cps
Typically 135 eV @ 5.9 keV/1000 cps |
| Radiation levels | < 1 µSv/h at 10 cm of the outside surface |
|---|
Integrate the Epsilon Xline into your production lines seamlessly with built-in OPC connectivity. The dedicated software package included makes it simple to set up your Epsilon Xline for different materials and measurement modes. By entering commands directly into the instrument – or via a remote console – the easy-to-use interface displays an overview of complete tracking data.
Analytical EDXRF software package for Epsilon benchtop systems
Determination of composition and thickness of coatings and multi-layers
Please contact support for the latest user manuals.
Please contact support for the latest software version.
To assure that your instrument remains in top condition and performs on the highest level, Malvern Panalytical offers a wide range of services. Our expertise and support services assure an optimal functioning of your instrument.
Service for a lifetime
Adding value to your processes
Advanced elemental analysis for in-line on-product inspection. Making continuous, reliable monitoring easy.