Free Nanoparticle Characterization Seminars – USA & Canada

by Malvern Panalytical, Thursday, 7th May 2015

During May & June we’re running a series of free seminars in the USA and Canada for people who want to learn more about the latest methods for nanoparticle characterization.

The seminars will each last 1.5 days, giving you the chance to learn about a complementary range of technologies for characterizing nanoparticles including Dynamic Light Scattering (DLS), Nanoparticle Tracking Analysis (NTA), Gel Permeation Chromatography (GPC), Microcalorimetry, Rheology and Resonant Mass Measurement (RMM). You will learn about the advantages and limitations of each technology, hear about the latest developments and see lots of applications examples. Most importantly, you will leave equipped with an understanding of the relevance of each technology for YOUR applications.

Plus you will also have the chance to get up close to the instruments and talk to our technology experts in small group sessions. Our specialists will be on hand to discuss your application questions and help ensure you get the most value from your instrument. These sessions will be ideal for existing users with questions about data interpretation, needing tips & tricks to optimize measurements, or interested in getting the most value from our software – a unique opportunity to get guidance from recognized experts in the field.

There are five seminars, in San Francisco, San Diego, Chicago, Toronto and Montreal. Please click on the links below for more information and to sign up. Places are limited so register now to save your spot:

San Francisco – May 19-20 2015

San Diego – May 21-22 2015

Chicago – May 21-22 2015

Toronto – June 8-9 2015

Montréal – June 10-11 2015

Free eBook: Nanoparticle Tracking Analysis – The first 1000 applications