This session of ‘Ask an Expert!’ is all about semi-quantitative analysis with an Epsilon 4 ED-XRF spectrometer using Malvern Panalytical’s Omnian software package. After this webinar, you will be able to make the best use of Omnian and get the best results for whatever sample is used. We will demonstrate how to optimize the spectra, make the best use of processing parameters, and show how to get the best accuracy using additional (in-type) standards (TAGs).
For this webinar, we’ll assume you’ve watched the previous one on the same topic. Don't worry if you missed it or can't remember it – you can watch it back here.
Don’t forget to bring your questions or submit them by emailing askanexpert@malvernpanalytical.com. (For inclusion in the webinar presentation, questions and data can be submitted up to 10 days upfront. There is also the opportunity to ask questions on the day.)
More information:
This webinar is part of our ongoing ‘Ask an expert’ webinar series. These live webinars are meant for students, researchers, and professors alike who want to sharpen their analytical methods, deepen their knowledge, or find out how to improve their data.
We’ll provide extensive materials analysis information and answer your most frequently asked questions. In other words, it’s the ultimate way to improve your materials science research and engineering knowledge.
It’s free to attend any of the classes. For a full overview of the 2022 program, click here.
To watch any of last year’s webinars, take a look at the full program recordings here.
Speakers
- Vincent Kip - Application Specialist XRF
More information
Who should attend?
- Students, researchers, or professors, interested in improving their materials science research and engineering knowledge with our analytical solutions
What will you learn?
- How to optimize spectra How to make the best use of processing parameters
- How to use a Tag