The possibility to perform bulk analysis as well as small spot mapping on a single spectrometer helps improve your product quality and resolve production issues. We are therefore proud to announce the new HiPer Small Spot Mapping (HiPer SSM) option as the latest addition to the Zetium spectrometer’s SumXcore platform. Measurements using the HiPer SSM require minimal sample preparation and can be completed much faster as compared to alternative techniques, thereby enabling investigations previously too time-consuming or complicated to perform in R&D or production control environments. The HiPer SSM can help you:
These benefits can be achieved due to the unique combination of wavelength dispersive (WD) and energy dispersive (ED) technologies as part of the Zetium spectrometer’s SumXcore platform. The HiPer SSM uses the ED core to provide fast, simultaneous and multi-element analysis on small spots with uncompromised accuracy and precision on the WD core for routine bulk analysis.
The benefits of the HiPer SSM have been demonstrated for a variety of applications. A 40 spot map of a polymer inclusion can be completed with the HiPer SSM in under 10 minutes compared to over 2.5 hours on a wavelength-based small spot mapping system. With the HiPer SSM it is now feasible to investigate the hydration kinetics of mortar and cement, which is very complicated on alternative techniques such as SEM-EDS and petrography due to the extensive sample preparation and required expertise.
